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dual-channel, digital isolators, enhanced system-level esd reliability data sheet adum3200 / adum3201 rev. c information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective owners. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 www.analog.com fax: 781.461.3113 ?2006C2012 analog devices, inc. all rights reserved. features enhanced system-level esd performance per iec 61000-4-x high temperature operation: 125c narrow body, rohs-compliant, 8-lead soic low power operation 5 v operation 1.7 ma per channel maximum @ 0 mbps to 2 mbps 3.7 ma per channel maximum @ 10 mbps 7.0 ma per channel maximum @ 25 mbps 3 v operation 1.5 ma per channel maximum @ 0 mbps to 2 mbps 2.5 ma per channel maximum @ 10 mbps 4.7 ma per channel maximum @ 25 mbps bidirectional communication 3 v/5 v level translation high data rate: dc to 25 mbps (nrz) precise timing characteristics 3 ns maximum pulse width distortion 3 ns maximum channel-to-channel matching high common-mode transient immunity: >25 kv/s safety and regulatory approvals ul recognition: 2500 v rms for 1 minute per ul 1577 csa component acceptance notice #5a vde certificate of conformity din v vde v 0884-10 (vde v 0884-10): 2006-12 v iorm = 560 v peak qualified for automotive applications applications size-critical multichannel isolation spi interface/data converter isolation rs-232/rs-422/rs-485 transceiver isolation digital field bus isolation hybrid electric vehicles, battery monitor general description the adum3200 / adum3201 1 are dual-channel, digital isola- tors based on the analog devices, inc., i coupler? technology. combining high speed cmos and monolithic transformer technology, these isolation components provide outstanding performance characteristics superior to alternatives such as optocoupler devices. by avoiding the use of leds and photodiodes, i coupler devices remove the design difficulties commonly associated with optocouplers. the typical optocoupler concerns regarding uncertain current transfer ratios, nonlinear transfer functions, and temperature and lifetime effects are eliminated with the simple i coupler digital interfaces and stable performance char- acteristics. the need for external drivers and other discrete components is eliminated with these i coupler products. further- more, i coupler devices consume one-tenth to one-sixth the power of optocouplers at comparable signal data rates. the adum3200 / adum3201 isolators provide two independent isolation channels in a variety of channel configurations and data rates (see the ordering guide). they operate with 3.3 v or 5 v supply voltages on either side, providing compatibility with lower voltage systems as well as enabling voltage translation functionality across the isolation barrier. the adum3200w and adum3201w are automotive grade versions qualified for 125c operation. in comparison to the adum120x isolators, the adum3200/ adum3201 isolators contain various circuit and layout changes to provide increased capability relative to system-level iec 61000-4-x testing (esd, burst, and surge). the precise capability in these tests for either the adum120x or adum3200/ adum3201 products is strongly determined by the design and layout of the users board or module. for more information, see the an-793 application note, esd/latch-up considerations with icoupler isolation products. 1 protected by u.s. patents 5,952,849; 6,873,065; 7,075,329. functional block diagrams encode decode encode decode v dd1 v ia v ib g nd 1 v dd2 v oa v ob gnd 2 1 2 3 4 8 7 6 5 0 5927-001 figure 1. adum3200 functional block diagram encode decode decode encode v dd1 v oa v ib g nd 1 v dd2 v ia v ob gnd 2 1 2 3 4 8 7 6 5 0 5927-002 figure 2. adum3201 functional block diagram
adum3200/adum3201 data sheet rev. c | page 2 of 20 table of contents features .............................................................................................. 1 applications ....................................................................................... 1 general description ......................................................................... 1 functional block diagrams ............................................................. 1 revision history ............................................................................... 2 sp ecifications ..................................................................................... 3 electrical characteristics 5 v, 105 c operation ................... 3 electrical characteristics 3 v, 105c operation ................... 4 electrical characteristics mixed 5 v/3 v, 105c operation .. 5 electrical characteristics mixed 3 v/5 v, 105c operation .. 6 electrical characteristics 5 v, 125c operation ................... 7 electrical characteristics 3 v, 125c operation ................... 8 electrical characteristics mixed 5 v/3 v, 125c operation .. 9 electrical characteristics mixed 3 v/5 v, 125c operation 10 package characteristics ............................................................. 11 regulatory information ............................................................. 11 insulation and safety - related specifications .......................... 11 din v vde v 0884 - 10 (vde v 0884 - 10) insulation characteristics ............................................................................ 12 recommended operating conditions .................................... 12 absolute maximum ratings ......................................................... 13 esd caution ................................................................................ 13 pin configurations and function descriptions ......................... 14 typical performance characteristics ........................................... 15 application information ................................................................ 16 pc board layout ........................................................................ 16 system - level esd considerations and enhancements ........ 16 propagation delay - related parameters ................................... 16 dc correctness and magnetic field immunity ........................... 16 power consumption .................................................................. 18 insulation lifetime ..................................................................... 18 outline dimensions ....................................................................... 19 ordering guide .......................................................................... 20 automotive products ................................................................. 20 revision history 2 /1 2 rev. b to rev. c created hyperlink for safety and regulatory approvals entry in features section ................................................................. 1 change to pc board layout section ............................................ 16 11 /11 rev. a to rev. b changes to features section , applications sec tion , and general descriptions section ......................................................... 1 changes to specifications section .................................................. 3 changes to table 29 ........................................................................ 12 changes to ambient operating temperature maximum value, table 30 ................................................................................ 13 changes to v dd1 pin descriptions ............................................... 14 changes to figure 9, figure 10, figure 11 caption s ................. 15 changes to ordering guide ......................................................... 20 added automotive products section ........................................... 20 6/07 rev. 0 to rev. a updated vde certification throughout ....................................... 1 changes to features, general description, and note 1 ............... 1 changes to regulatory information section .............................. 10 changes to din v vde v 0884- 10 (vde v 0884 - 10) insulation characteristics section ................................................ 11 added table 10 ............................................................................... 12 adde d insulation lifetime section .............................................. 17 7/06 revision 0: initial version
data sheet adum3200/adum3201 rev. c | page 3 of 20 specifications electrical character istics 5 v, 105 c operation all typical specifications are at t a = 25c, v dd1 = v dd2 = 5 v. minimum/maximum specifications apply over the entire recommended operation range: 4.5 v v dd1 5.5 v, 4.5 v v dd2 5.5 v, and ?40c t a + 105c , unless otherwise noted. switching specifications are tested with c l = 15 p f and cmos signal levels, unless otherwise noted. table 1 . a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 20 1 50 20 50 20 45 ns 50% input to 50% output pulse width distortion pwd 40 3 3 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 10 0 15 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 15 15 ns output rise/fall time t r /t f 10 2.5 2.5 ns 10% to 90% table 2. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 1.3 1.7 3.5 4.6 7.7 10.0 ma no load i dd2 1.0 1.6 1.7 2.8 3.1 3.9 ma n o load adum3201 i dd1 1.1 1.5 2.6 3.4 5.3 6.8 ma no load i dd2 1.3 1.8 3.1 4.0 6.4 8.3 ma no load table 3 . for all models parame ter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 5.0 v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 4.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx s upply current per channel quiescent input supply current i ddi(q) 0.4 0.8 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.5 0.6 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.19 ma/mbps dynamic output supply current i d do(d) 0.05 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh rate f r 1.2 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum3200/adum3201 data sheet rev. c | page 4 of 20 electrical character istics 3 v, 105c operation all typical specificati ons are at t a = 25c, v dd1 = v dd2 = 3.0 v. minimum/maximum specifications apply over the entire reco mmended operation range: 2.7 v v dd1 3.6 v, 2.7 v v dd2 3.6 v , and ?40c t a + 105c , unless otherwise noted. switching specifications are tested wi th c l = 15 pf and cmos signal levels, unless otherwise noted. table 4 . a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 20 15 0 20 60 20 55 ns 50% input to 50% output pulse width distortion pwd adum3200 40 3 3 ns |t plh ? t phl | adum3201 40 4 4 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pw d limit propagation delay skew t psk 100 22 16 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 22 16 ns output rise/fall time t r /t f 3.0 3.0 3.0 ns 10% to 90% table 5 . parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 0.8 1.3 2.0 3.2 4.3 6.4 ma no load i dd2 0.7 1.0 1.1 1.7 1.8 2.4 ma no load adum3201 i dd1 0.7 1.3 1.5 2.1 3.0 4.2 ma no load i dd2 0.8 1.6 1.9 2.4 3.6 5.1 ma no load table 6 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 3.0 v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 2.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.3 0.5 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.3 0.5 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.10 ma/mbps dynamic output supply current i ddo(d) 0.03 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v re fresh rate f r 1.1 mbps 1 |cm| is the m aximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
data sheet adum3200/adum3201 rev. c | page 5 of 20 electrical character istics mixed 5 v/3 v, 105c operation all typical specifications are a t t a = 25c, v dd1 = 5 v, v dd2 = 3 . 0 v. minimum/maximum specifications apply over the entire recommended operation range: 4.5 v v dd1 5.5 v, 2.7 v v dd2 3.6 v, and ?40c t a + 105c, unless otherwise noted. switching specifications are tested with c l = 15 pf, and cmos signal levels, unless otherwise noted. table 7 . a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 15 150 15 55 15 50 ns 50% input to 50% output pulse width di stortion pwd 40 3 3 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 50 22 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 22 15 ns output rise/fall time t r /t f 3.0 3.0 3.0 ns 10% to 90% table 8 . parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 1.3 1.7 3.5 4.6 7.7 10.0 ma no load i dd2 0.7 1.0 1.1 1.7 1.8 2.4 ma no load adum3201 i dd1 1.1 1.5 2.6 3.4 5.3 6.8 ma no load i dd2 0.8 1.6 1.9 2.4 3.6 5.1 ma no load table 9 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.8 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 v dd x v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 v dd x ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.4 0.8 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.3 0.5 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.19 ma/mbps dynamic output supply cu rrent i ddo(d) 0.03 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh rate f r 1.2 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustai ned while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum3200/adum3201 data sheet rev. c | page 6 of 20 electrical character istics mixed 3 v/5 v, 105c operation all typical speci fications are at t a = 25c, v dd1 = 3 v, v dd2 = 5 . 0 v. minimum/maximum specifications apply over the entire reco mmended operation range: 2.7 v v dd1 3.6 v, 4.5 v v dd2 5.5 v , and ?40c t a + 105c, unless otherwise noted. switching spec ifications are tested with c l = 15 pf and cmos signal levels, unless otherwise noted. table 10. a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 15 150 15 55 15 50 ns 50% input to 50% output pulse width distortion pwd adum3200 40 3 3 ns |t plh ? t phl | adum3201 40 4 4 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 50 22 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 22 15 ns output rise/fall time t r /t f 2.5 2 .5 2.5 ns 10% to 90% table 11. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 0.8 1.3 2.0 3.2 4.3 6.4 ma no load i dd2 1.0 1.6 1.7 2.8 3.1 3.9 ma no load adum3201 i dd1 0.7 1.3 1.5 2.1 3.0 4.2 ma no load i dd2 1.3 1.8 3.1 4.0 6.4 8.3 ma no load table 12 . for all models parameter symbol min typ max unit test conditions dc specifications lo gic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.4 0.3 v dd x v logic high output voltages v oh v dd x ? 0. 1 v dd x v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 v dd x ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0. 0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.3 0.5 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.5 0.6 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.10 ma/mbps dynamic output supply current i ddo(d) 0.05 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 100 0 v, transient magnitude = 800 v refresh rate f r 1.1 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode vol tage slew rates apply to both rising and falling common - mode voltage edges.
data sheet adum3200/adum3201 rev. c | page 7 of 20 electrical character istics 5 v, 125c operation all typical specifications are at t a = 25c, v dd1 = v dd2 = 5 v. minimum/maximum specifications apply over the entire recommended operation ran ge: 4.5 v v dd1 5.5 v, 4.5 v v dd2 5.5 v, and ?40c t a + 125c, unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels, unless otherwise noted. table 13. a grade b grade c grad e parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 20 1 50 20 50 20 45 ns 50% input to 50% output pulse widt h distortion pwd 40 3 3 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 10 0 15 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 15 15 ns output rise/fall time t r /t f 2.5 2.5 2.5 ns 10% to 90% table 14. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grad e 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 1.3 2.0 3.5 4.6 7.7 10.0 ma no load i dd2 1.0 1.6 1.7 2.8 3.1 3.9 ma no load adum3201 i dd1 1.1 1.5 2.6 3.4 5.3 6.8 ma no load i dd2 1.3 1.8 3.1 4.0 6.4 8.3 ma no load table 15 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 5.0 v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 4.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx su pply current per channel quiescent input supply current i ddi(q) 0.4 0.8 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.5 0.6 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.19 ma/mbps dynamic output supply current i dd o(d) 0.05 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh rate f r 1.2 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum3200/adum3201 data sheet rev. c | page 8 of 20 electrical character istics 3 v, 125c operation all typical specificatio ns are at t a = 25c, v dd1 = v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 3.0 v v dd1 3.6 v, 3.0 v v dd2 3.6 v, and ?40c t a + 125c, unless otherwise noted. switching specifications are tested wit h c l = 15 pf and cmos signal levels, unless otherwise noted. table 16. a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 20 15 0 20 60 20 55 ns 50% input to 50% output pulse width distortion pwd adum3200 40 3 3 ns |t plh ? t phl | adum3201 40 4 4 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pw d limit propagation delay skew t psk 100 22 16 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 22 16 ns output rise/fall time t r /t f 3.0 3.0 3.0 ns 10% to 90% table 17. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 0.8 1.3 2.0 3.2 4.3 6.4 ma no load i dd2 0.7 1.0 1.1 1.7 1.8 2.4 ma no load adum3201 i dd1 0.7 1.3 1.5 2.1 3.0 4.2 ma no load i dd2 0.8 1.6 1.9 2.4 3.6 5.1 ma no load table 18 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshol d v ih 0.7 v dd x v logic low input threshold v il 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 3.0 v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 2.8 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.3 0.5 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.3 0.5 ma v i a = v ib = 0 v dynamic input supply current i ddi(d) 0.10 ma/mbps dynamic output supply current i ddo(d) 0.03 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v r efresh rate f r 1.1 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
data sheet adum3200/adum3201 rev. c | page 9 of 20 electrical character istics mixed 5 v/3 v, 125c operation all typic al specifications are at t a = 25c, v dd1 = 5 v, v dd2 = 3.0 v. minimum/maximum specifications apply over the entire recommended operation range: 4.5 v v dd1 5.5 v, 3.0 v v dd2 3.6 v, and ?40c t a + 125c , unless otherwise noted. switching specifications are tested with c l = 15 pf and cmos signal levels, unless otherwise noted. table 19. a grade b grade c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 15 150 15 55 15 50 ns 50% input to 50% output pulse width di stortion pwd 40 3 3 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 50 22 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing -d irection t pskod 50 22 15 ns output rise/fall time t r /t f 3.0 3.0 3.0 ns 10% to 90% table 20. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 1.3 2.0 3.5 4.6 7.7 10.0 ma no load i dd2 0.7 1.0 1.1 1.7 1.8 2.4 ma n o load adum3201 i dd1 1.1 1.5 2.6 3.4 5.3 6.8 ma no load i dd2 0.8 1.6 1.9 2.4 3.6 5.1 ma no load table 21 . for all models parameter symbol min typ max unit test conditions dc specifications logic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.8 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 v dd x v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 v dd x ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.4 0.8 ma v ia = v ib = 0 v quiescent output supply current i ddo(q) 0.3 0.5 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.19 ma/mbps dynamic output supply cu rrent i ddo(d) 0.03 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh rate f r 1.2 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
adum3200/adum3201 data sheet rev. c | page 10 of 20 electrical character istics mixed 3 v/5 v, 125c operation all typical sp ecifications are at t a = 25c, v dd1 = 3 v, v dd2 = 5.0 v. minimum/maximum specifications apply over the entire recommended operation range: 3.0 v v dd1 3.6 v, 4.5 v v dd2 5.5 v, and ?40c t a + 125c, unless otherwise noted. switching speci fications are tested with c l = 15 pf and cmos signal levels, unless otherwise noted. table 22. a grade b gra de c grade parameter symbol min typ max min typ max min typ max unit test conditions switching specifications data rate 1 10 25 mbps within pwd limit propagation delay t phl , t plh 15 150 15 55 15 50 ns 50% input to 50% output pulse width distortion pwd adum3200 40 3 3 ns |t plh ? t phl | adum3201 40 4 4 ns |t plh ? t phl | change vs. temperature 6 5 5 ps/c pulse width pw 1000 100 40 ns within pwd limit propagation delay skew t psk 50 22 15 ns between any two units channel matching codirectional t pskcd 50 3 3 ns opposing - direction t pskod 50 22 15 ns output rise/fall time t r /t f 2.5 2. 5 2.5 ns 10% to 90% table 23. parameter symbol 1 mbps a grade, b grade, and c grade 10 mbps b grade and c grade 25 mbps c grade unit test conditions min typ max min typ max min typ max supply current adum3200 i dd1 0.8 1.3 2.0 3.2 4.3 6.4 ma no load i dd2 1.0 1.6 1.7 2.8 3.1 3.9 ma no load adum3201 i dd1 0.7 1.3 1.5 2.1 3.0 4.2 ma no load i dd2 1.3 1.8 3.1 4.0 6.4 8.3 ma no load table 24 . for all models parameter symbol min typ max unit test conditions dc specifications lo gic high input threshold v ih 0.7 v dd x v logic low input threshold v il 0.4 0.3 v dd x v logic high output voltages v oh v dd x ? 0.1 v dd x v i ox = ?20 a, v ix = v ixh v dd x ? 0.5 v dd x ? 0.2 v i ox = ?4 ma, v ix = v ixh logic low output voltages v ol 0.0 0.1 v i ox = 20 a, v ix = v ixl 0.2 0.4 v i ox = 4 ma, v ix = v ixl input current per channel i i ?10 +0.01 +10 a 0 v v ix v ddx supply current per channel quiescent input supply current i ddi(q) 0.3 0.5 ma v ia = v ib = 0 v quiescent output su pply current i ddo(q) 0.5 0.6 ma v ia = v ib = 0 v dynamic input supply current i ddi(d) 0.10 ma/mbps dynamic output supply current i ddo(d) 0.05 ma/mbps ac specifications common - mode transient immunity 1 |cm| 25 35 kv/s v ix = v ddx , v cm = 1000 v, transient magnitude = 800 v refresh rate f r 1.1 mbps 1 |cm| is the maximum common - mode voltage slew rate that can be sustained while maintaining v o > 0.8 v dd . the common - mode voltage slew rates apply to both rising and falling common - mode voltage edges.
data sheet adum3200/adum3201 rev. c | page 11 of 20 package characterist ics table 25 . parameter symbol min typ max unit test conditions resistance (input to output) 1 r i - o 10 12 ? capacitance (input to output) 1 c i - o 1.0 pf f = 1 mhz input capacitance c i 4.0 pf ic junction - to - case thermal resistance, side 1 jci 46 c/w thermocouple located at center of package underside ic jun ction - to - case thermal resistance, side 2 jco 41 c/w 1 the d evice is considered a 2- terminal device ; pin 1, pin 2, pin 3, and pin 4 are shorted together, and pin 5, pin 6 , pin 7 , and pin 8 are shorted together. regulatory informati on the adum3200 / adum3201 devices are approved by the organizations listed in table 26. refer to table 31 and the insulation lifetime section for details regarding recommended maximum working voltages for specific cross - isolation waveforms and insulation levels. table 26 . ul csa vde recognized under ul 1577 component recognition program 1 approved under csa component acceptance notice #5 a certified according to din v vde v 0884 - 10 (vde v 0884 - 10): 2006 - 12 2 single/ b asic 2500 v rms isolation voltage basic insulation per csa 60950 -1- 03 and iec 60950 - 1, 400 v rms (566 v peak) maximum working voltage functional insulation per csa 60950 -1- 03 and iec 60950 - 1, 800 v rms (1131 v peak) maximum working voltage reinforced insulation, 560 v peak file e214100 file 205078 file 2471900 - 4880 - 0001 1 in accordance with ul 1577, each adum320x is proof - tested by applying an insulation test voltage 3000 v rms for 1 second (current leakage detection limit = 5 a) . 2 in accordance with din v vde v 0884 - 10 , ea ch adum320x is proof tested by applying an insulation test voltage 1 050 v p eak fo r 1 second (partial discharge detection lim it = 5 pc). an asterisk (*) marking branded on the component designates din v vde v 0884 - 10 approval. insulation and safet y- related specificatio ns table 27 . parameter symbol value unit conditions rated dielectric insulation voltage 2500 v rms 1- minute duration minimum external air gap (clearance) l(i01) 4.90 min mm measured from input terminals to output terminals, shortest distance through air minimum external trackin g (creepage) l(i02) 4.01 min mm measured from input terminals to output terminals, shortest distance path along body minimum internal gap (internal clearance) 0.017 min mm insulation distance through insulation tracking resistance (comparative t racking index) cti >175 v din iec 112/vde 0303 part 1 isolation group iiia material group (din vde 0110, 1/89, table 1)
adum3200/adum3201 data sheet rev. c | page 12 of 20 din v vde v 0884 - 10 (vde v 0884 - 10) insulation character istics these isolators are suitable for reinforced isolation only wi thin the safety limit data. maintenance of the safety data is ensured by protective circuits. the asterisk ( *) marking on the package denotes din v vde v 0884 - 10 approval for a 560 v peak working voltage. table 28 . description cond itions symbol characteristic unit installation classification per din vde 0110 for rated mains voltage 150 v rms i to iv for rated mains voltage 300 v rms i to iii for rated mains voltage 400 v rms i to ii climatic classification 40/105/21 pollution degree per din vde 0110, table 1 2 maximum working insulation voltage v iorm 560 v peak input - to - output test voltage, method b1 v iorm 1.875 = v pr , 100% production test, t m = 1 sec, partial discharge < 5 pc v pr 1050 v peak inp ut - to - output test voltage, method a v iorm 1.6 = v pr , t m = 60 sec, partial discharge < 5 pc v pr after environmental tests subgroup 1 896 v peak after input and/ or safety test subgroup 2 and subgroup 3 v iorm 1.2 = v pr , t m = 60 sec, partial discha rge < 5 pc 672 v peak highest allowable overvoltage transient overvoltage, t tr = 10 seconds v tr 4000 v peak safety - limiting values maximum value allowed in the event of a failure ( see figure 3 ) case temperature t s 150 c side 1 current i s1 1 60 ma side 2 current i s2 1 70 ma insulation resistance at t s v io = 500 v r s >10 9 ? case temperature (c) safety-limiting current (ma) 0 0 200 180 100 80 60 40 20 50 100 150 200 side #1 side #2 120 140 160 05927-003 figure 3 . thermal derating curve, dependence of safety - limiting values on case temperature, per din v vde v 0884 - 10 recommended operating conditions table 29 . parameter symbol min max unit oper ating temperature t a adum3200 a/ adum3201 a ?40 +105 c adum3200 b/ adum3201 b ?40 +105 c adum3200 c/ adum3201 c ?40 +105 c adum3200 wa/ adum3201 wa ?40 +125 c adum3200 wb/ adum3201 wb ?40 +125 c adum3200 wc/ adum3201 wc ?40 +125 c supply voltages 1 v d d1 , v dd2 adum3200 a/ adum3201 a 2.7 5.5 v adum3200 b/ adum3201 b 2.7 5.5 v adum3200c/adum3201c 2.7 5.5 v adum3200 wa/ adum3201 wa 3.0 5.5 v adum3200 wb/ adum3201 wb 3.0 5.5 v adum3200 wc/ adum3201 wc 3.0 5.5 v maximum i nput signal rise and fall times 1.0 ms 1 all voltages are relative to their respective ground. see the dc correctness and magnetic field immunity section for information on immunity to external magnetic fields.
data sheet adum3200/adum3201 rev. c | page 13 of 20 absolute maximum ratings ambient temperature = 25c, unless otherwise noted. table 30. parameter rating storage temperature (t st ) ?55c to +150c ambient operating temperature (t a ) ?40c to +125c supply voltages (v dd1 , v dd2 ) 1 ?0.5 v to +7.0 v input voltage (v ia , v ib ) 1, 2 ?0.5 v to v ddi + 0.5 v output voltage (v oa , v ob ) 1, 2 ?0.5 v to v ddo + 0.5 v average output current, per pin (i o ) 3 ?22 ma to +22 ma common-mode transients (cm l , cm h ) 4 ?100 kv/s to +100 kv/s 1 all voltages are relative to their respective ground. 2 v ddi and v ddo refer to the supply voltages on the input and output sides of a given channel, respectively. 3 see figure 3 for maximum rated curre nt values for various temperatures. 4 refers to common-mode transients across the insulation barrier. common- mode transients exceeding the absolute maximum ratings can cause latch-up or permanent damage. stresses above those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. esd caution table 31. maximum continuous working voltage 1 parameter max unit constraint ac voltage, bipolar waveform 565 v peak 50-year minimum lifetime ac voltage, unipolar waveform functional insulation 1131 v peak maximum approved working voltage per iec 60950-1 basic insulation 560 v peak maximum approved working voltage per iec 60950-1 and vde v 0884-10 dc voltage functional insulation 1131 v peak maximum approved working voltage per iec 60950-1 basic insulation 560 v peak maximum approved working voltage per iec 60950-1 and vde v 0884-10 1 refers to continuous voltage magnitude impos ed across the isolation barrier. see the in sulation lifetime section for more detai ls. table 32. adum3200 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powered h h l l powered powered l l h l powered powered h l l h powered powered l h x x unpowered powered h h outputs return to the input state within 1 s of v ddi power restoration. x x powered unpowered indeterminate indeterminate outputs return to the input state within 1 s of v ddo power restoration. table 33. adum3201 truth table (positive logic) v ia input v ib input v dd1 state v dd2 state v oa output v ob output notes h h powered powered h h l l powered powered l l h l powered powered h l l h powered powered l h x x unpowered powered indeterminate h outputs return to the input state within 1 s of v ddi power restoration. x x powered unpowered h indeterminate outputs return to the input state within 1 s of v ddo power restoration.
adum3200/adum3201 data sheet rev. c | page 14 of 20 pin configurations and function descriptions 05927-004 v dd1 1 v ia 2 v ib 3 gnd 1 4 v dd2 8 v oa 7 v ob 6 gnd 2 5 adum3200 top view (not to scale) figure 4. adum3200 pin configuration table 34. adum3200 pin function descriptions pin no. mnemonic description 1 v dd1 supply voltage for isolator side 1 . 2 v ia logic input a. 3 v ib logic input b. 4 gnd 1 ground 1. gro und reference for isolator side 1. 5 gnd 2 ground 2. ground reference for isolator side 2. 6 v ob logic output b. 7 v oa logic output a. 8 v dd2 supply voltage for isolator side 2 . 05927-005 v dd1 1 v oa 2 v ib 3 gnd 1 4 v dd2 8 v ia 7 v ob 6 gnd 2 5 adum3201 top view (not to scale) figure 5. adum3201 pin configuration table 35. adum3201 pin function descri ptions pin no. mnemonic description 1 v dd1 supply voltage for isolator side 1 . 2 v oa logic output a. 3 v ib logic input b. 4 gnd 1 ground 1. ground reference for isolator side 1. 5 gnd 2 ground 2. ground reference for isolator side 2. 6 v ob logic output b. 7 v ia logic input a. 8 v dd2 supply voltage for isolator side 2 .
data sheet adum3200/adum3201 rev. c | page 15 of 20 typical performance characteristics data rate (mbps) current/channel (ma) 0 0 6 2 8 10 10 20 30 5v 3v 4 05927-006 figure 6 . typical input supply current per channel vs. data rate for 5 v and 3 v operation data rate (mbps) current/channel (ma) 0 0 3 2 1 4 10 20 30 5v 3v 05927-007 fi gure 7 . typical output supply current per channel vs. data rate for 5 v and 3 v operation (no output load) data rate (mbps) current/channel (ma) 0 0 3 2 1 4 10 20 30 5v 3v 05927-008 figure 8 . typical output supply current per channel vs. data rate for 5 v and 3 v operation ( 15 pf output load) data rate (mbps) current (ma) 0 0 15 10 5 20 10 20 30 5v 3v 05927-009 figure 9 . typical adum3200 i dd1 supply current vs. data rate for 5 v and 3 v operation data rate (mbps) current (ma) 0 0 3 2 1 4 10 20 30 5v 3v 05927-010 figure 10 . typical adum3200 i dd2 supply current vs. data rate for 5 v and 3 v operation data rate (mbps) current (ma) 0 0 6 2 8 10 10 20 30 5v 3v 4 05927-011 figure 11 . typical adum3201 i dd1 or i dd2 supply current vs. data rate for 5 v and 3 v operation
adum3200/adum3201 data sheet rev. c | page 16 of 20 application information pc board layout the adum3200 / adum3201 digital isolators require no external interface circuitry for the logic interfaces. power supply bypassing is strongly recommended at the input and output supply pins. the capacitor value should be between 0.01 f and 0.1 f. the total lead length between both ends of the capacitor and the input power supply pin should not exceed 20 mm. see the an-1109 application note for board layout guidelines. system-level esd considerations and enhancements system-level esd reliability (for example, per iec 61000-4-x) is highly dependent on system design which varies widely by application. the adum3200/ adum3201 incorporate many enhancements to make esd reliability less dependent on system design. the enhancements include: ? esd protection cells added to all input/output interfaces. ? key metal trace resistances reduced using wider geometry and paralleling of lines with vias. ? the scr effect inherent in cmos devices minimized by use of guarding and isolation technique between pmos and nmos devices. ? areas of high electric field concentration eliminated using 45 corners on metal traces. ? supply pin overvoltage prevented with larger esd clamps between each supply pin and its respective ground. while the adum3200 / adum3201 improve system-level esd reliability, they are no substitute for a robust system-level design. see the an-793 application note, esd/latch-up considerations with i coupler isolation products for detailed recommendations on board layout and system-level design. propagation delay-related parameters propagation delay is a parameter that describes the time it takes a logic signal to propagate through a component. the propagation delay to a logic low output can differ from the propagation delay to a logic high. input (v ix ) output (v ox ) t plh t phl 50% 50% 05927-012 figure 12. propagation delay parameters pulse width distortion is the maximum difference between these two propagation delay values and is an indication of how accurately the input signals timing is preserved. channel-to-channel matching refers to the maximum amount that the propagation delay differs between channels within a single adum3200 / adum3201 component. propagation delay skew refers to the maximum amount that the propagation delay differs between multiple adum3200/ adum3201 components operating under the same conditions. dc correctness and magnetic field immunity positive and negative logic transitions at the isolator input cause narrow (~1 ns) pulses to be sent to the decoder via the transformer. the decoder is bistable and is therefore either set or reset by the pulses, indicating input logic transitions. in the absence of logic transitions of more than ~1 s at the input, a periodic set of refresh pulses indicative of the correct input state are sent to ensure dc correctness at the output. if the decoder receives no internal pulses for more than about 5 s, the input side is assumed to be unpowered or nonfunctional, in which case, the isolator output is forced to a default state (see table 32 and table 33) by the watchdog timer circuit. the adum3200 / adum3201 are extremely immune to external magnetic fields. the limitation on the adum3200 / adum3201 s magnetic field immunity is set by the condition in which induced voltage in the transformers receiving coil is sufficiently large to either falsely set or reset the decoder. the following analysis defines the conditions under which this can occur. the 3 v operating condition of the adum3200 / adum3201 is examined because it represents the most susceptible mode of operation. the pulses at the transformer output have an amplitude greater than 1.0 v. the decoder has a sensing threshold at about 0.5 v, therefore establishing a 0.5 v margin in which induced voltages can be tolerated. the voltage induced across the receiving coil is given by v = (? d / dt ) ? r n 2 , n = 1, 2,, n where: is the magnetic flux density (gauss). n is the number of turns in the receiving coil. r n is the radius of the nth turn in the receiving coil (cm).
data sheet adum3200/adum3201 rev. c | page 17 of 20 given the geometry of the receiving coil in the adum3200 / adum320 1 and an imposed requirement that the induced voltage is at most 50% of the 0.5 v margin at the decoder, a maximum allowable magnetic field is calculated, as shown in figure 13. magnetic field frequency (hz) 100 maximum allowable magnetic flux density (kgauss) 0.001 1m 10 0.01 1k 10k 10m 0.1 1 100m 100k 05927-013 figure 13 . maximum allowable external magnetic flux density for example, at a magnetic field frequency of 1 mhz, the maximum allowable magnetic field of 0.2 kgauss induces a voltage of 0.25 v at the receiving coil. this is about 50% of the sensing threshold and does not cause a faulty output transition. similarly, if such an event were to occur during a transmitted pulse (and had the worst - case polarity), it would reduce the received pulse from >1.0 v to 0.75 v still well above the 0.5 v sensing threshold of the decoder. the pr eceding magnetic flux density values correspond to specific current magnitudes at given distances away from the adum3200 / adum3201 transformers. figure 14 expresses these allowable current magnitudes as a function of frequency for selected distances. as seen, the adum3200 / adum3201 are extremely immune and can be affected only by extremely large currents op erated at high frequency and very close to the com - ponent . for the 1 mhz example, one would have to place a 0.5 ka current 5 mm away from the adum3200 / adum3201 to affect the components operation. magnetic field frequency (hz) maximum allowable current (ka) 1000 100 10 1 0.1 0.01 1k 10k 100m 100k 1m 10m distance = 5mm distance = 1m distance = 100mm 05927-014 figure 14 . maximum allowable current for various current -to- adum3200 / adum3201 spacing s note that at combinations of strong magnetic fields and high frequencies , any loops formed by printed circuit board traces could induce sufficiently large error voltages to trigger the threshold of succeeding circuitry. care should be taken in the layout of such traces to avoid this possibility.
adum3200/adum3201 data sheet rev. c | page 18 of 20 power consumption the supply c urrent at a given channel of the adum3200 / adum3201 isolator is a function of the supply voltage, the channels data rate, and the channels output load. for each input channel, the supply current is given by i ddi = i ddi ( q ) f 0.5 f r i ddi = i ddi ( d ) (2 f ? f r ) + i ddi (q) f > 0.5 f r f or each output channel, the supply current is given by i ddo = i ddo ( q ) f 0.5 f r i ddo = ( i ddo ( d ) + (0.5 10 ?3 ) c l v ddo ) (2 f ? f r ) + i ddo ( q ) f > 0.5 f r where: i ddi (d) , i ddo (d) are the input and output dynamic supply currents per channel (ma/mbps). c l is the output load capacitance ( pf). v ddo is the output supply voltage (v). f is the input logic signal frequency (mhz, half of the input data rate, nrz signaling). f r is the input stage refresh rate (mbps). i ddi (q) , i ddo (q) are the specified input and output quiescent supply curre nts (ma). t o calculate the total i dd1 and i dd2 supply current, the supply currents for each input and output channel corresponding to i dd1 and i dd2 are calculated and totaled. figure 6 provides per - channel input supply curre nts as a function of data rate. figure 7 and figure 8 provide per - channel output supply currents as a function of data rate for an unloaded output condition a nd for a 15 pf output condition, respectively. figure 9 through figure 11 provide total i dd1 and i dd2 supply current as a function of data rate for adum3200 and adum3201 channel configurations. insulation lifetim e all insulation structures eventually break down when subjected to voltage stress over a sufficiently long period . the rate of insulation degradation depends upon the characteristics of the voltage waveform applied across the insulation. in addition to t he testing performed by the regulatory agencies, analog devices ca r rie s out an extensive set of evaluations to determine the lif e time of the insulation structure within the adum3200 / adum3201 . a nalog devices performs accelerated life testing using voltage levels higher than the rated continuous working voltage. accel - e ration factors for several operating conditions are determined. t hese factors allow calculation of the time to failure at the actual working voltage . the values shown in table 31 summarize the peak voltage for 50 years of servic e life for a bipolar ac operating condition, and the maximum csa/vde approved working vol t age s. in many cases, the approved working voltage is higher than the 50- year service life voltage. operation at these high working voltages can lead to shortened insu lation life. t he insulation lifetime of the adum3200 / adum3201 de p ends on t he voltage waveform type imposed across the isol a tion barrier. the i coupler insulation structure degrades at different rates de pending on whether the waveform is bipolar ac, unipolar ac, or dc. figure 15, figure 16 , and figure 17 illu strate the se different isolation voltage wav e forms. a b ipolar ac voltage environment is the most stri ngent. the goal of a 50 - year operating lifetime under the ac bipolar conditio n determines the a nalog d evices recommended maximum working voltage. in the case of unipolar ac or dc voltage, the stress on the insu - lation is significantly lower. this allows operation at higher working voltages while still achieving a 50- year service li fe. the working voltages listed in table 31 can be applied while main taining the 50 - year minimum lifetime , provided that the voltage conforms to either the unipolar ac or dc voltage cases. any cross - insulation voltage wavefor m that does not conform to figure 16 or figure 17 should be treated as a bipolar ac wave form and its peak voltage should be limited to the 50- year lifetime voltage value listed in table 31 . note that the voltage presented in figure 16 is s hown as sinusoi - dal for illustration purposes only. it is meant to represent any voltage waveform varying between 0 v and some limiting value. the limiting va lue can be positive or negative, but the voltage cannot cross 0 v. 0v rated peak voltage 05927-015 figure 15 . bipolar ac waveform 0v rated peak voltage 05927-016 figure 16 . unipolar ac waveform 0v rated peak voltage 05927-017 figure 17 . dc waveform
data sheet adum3200/adum3201 rev. c | page 19 of 20 outline dimensio ns controlling dimensions are in millimeters; inch dimensions (in parentheses) are rounded-off millimeter equivalents for reference only and are not appropriate for use in design. compliant to jedec standards ms-012-aa 012407-a 0.25 (0.0098) 0.17 (0.0067) 1.27 (0.0500) 0.40 (0.0157) 0.50 (0.0196) 0.25 (0.0099) 45 8 0 1.75 (0.0688) 1.35 (0.0532) seating plane 0.25 (0.0098) 0.10 (0.0040) 4 1 8 5 5.00 (0.1968) 4.80 (0.1890) 4.00 (0.1574) 3.80 (0.1497) 1.27 (0.0500) bsc 6.20 (0.2441) 5.80 (0.2284) 0.51 (0.0201) 0.31 (0.0122) coplanarity 0.10 figure 18 . 8 - lead standard small outline package [ soic_n ] narrow body (r - 8) dimensions shown in millimeters (inches)
adum3200/adum3201 data sheet rev. c | page 20 of 20 ordering guide model 1 , 2 number of inputs, v dd1 side number of inputs, v dd2 side maximum data rate (mbps) m aximum propagation delay, 5 v (ns) maximum pulse width distortion (ns) temperature range (c) package option 3 adum3200 arz 2 0 1 150 40 ?40 to +105 r-8 adum3200 arz - rl7 2 0 1 150 40 ?40 to +105 r-8 adum3200 brz 2 0 10 50 3 ?40 to +105 r-8 adum3200 brz - rl7 2 0 10 50 3 ?40 to +105 r-8 adum3200 crz 2 0 25 45 3 ?40 to +105 r-8 adum3200 crz - rl7 2 0 25 45 3 ?40 to + 105 r-8 adum3200 warz 2 0 1 150 40 ?40 to +1 2 5 r-8 adum3200 warz - rl7 2 0 1 150 40 ?40 to +1 2 5 r-8 adum3200wbrz 2 0 10 50 3 ?40 to +1 2 5 r-8 adum3200wbrz - rl7 2 0 10 50 3 ?40 to +1 2 5 r-8 adum3200wcrz 2 0 25 45 3 ?40 to +1 2 5 r-8 adum3200 w crz - rl7 2 0 25 45 3 ?40 to +1 2 5 r-8 adum3201 arz 1 1 1 150 40 ?40 to +105 r-8 adum3201 arz - rl7 1 1 1 150 40 ?40 to +105 r-8 adum3201 brz 1 1 10 50 3 ?40 to +105 r-8 adum3201 brz - rl7 1 1 10 50 3 ?40 to +105 r-8 ad um3201 crz 1 1 25 45 3 ?40 to +105 r-8 adum3201 crz - rl7 1 1 25 45 3 ?40 to +105 r-8 adum3201 warz 1 1 1 150 40 ?40 to +1 2 5 r-8 adum3201 warz - rl7 1 1 1 150 40 ?40 to +1 25 r-8 adum3201wbrz 1 1 10 50 3 ?40 to +1 25 r-8 adum3201wbrz - rl7 1 1 10 50 3 ?40 to +1 25 r-8 adum3201wcrz 1 1 25 45 3 ?40 to +1 25 r-8 adum3201 w crz - rl7 1 1 25 45 3 ?40 to +1 25 r-8 1 z = rohs compliant part. 2 w = qualified for automotive applications . 3 r- 8 = 8 - lea d narrow body soic_n. automotive products the adum3200 w/ adum3201 w models are available with controlled manufacturing to support the quality and reliability requirements of automotive applications. note that these automotive models may have specifications that differ from the commercial models; therefore, designers should review the specifications section of this data sheet carefully. only the automotive grade products shown are available for use in automotive applications. contact your local analog devices account representative for specific product ordering inform ation and to obtain the specific automotive reliabilit y reports for these models. ? 2006 ? 2012 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective owners. d05927 - 2/12(c)

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